Zeiss
Electron Microscope
Scanning Electron Microscopes (SEM) scan a sample with a focused electron beam and get images with information about the samples’ topography and composition.
Specification
CSEMs (conventional SEMs with a thermic electron source) and FE-SEMs (field emission SEMs with a field emission electron source) from ZEISS deliver high resolution imaging and superior materials contrast.
- High resolution surface sensitive information and materials contrast.
- Widely used in nanotechnology, materials research, life sciences, semiconductor, raw materials and industry.
Product Models
| # | Image | Model Name | Detail |
|---|---|---|---|
|
GeminiSEM | ZEISS GeminiSEM Field Emission Scanning Electron Microscope for highest demands in sub-nanometer imaging, analysis and sample flexibility. | |
|
SigmaSEM | ZEISS Sigma Field Emission Scanning Electron Microscope for High Quality Imaging and Advanced Analytical Microscopy. | |
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EVOSEM | ZEISS EVO Scanning Electron Microscope modular SEM platform for intuitive operation, routine investigations and research applications. |
Enquire About : Zeiss Electron Microscope
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